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Most Macintosh freeze-ups, crashes and other failures are easily found. Broken software, a bad drive or some other troubled peripheral problem can be solved with some simple detective work. Momentary lockups. The beachball that never goes away. Even a random restart for no reason resulting in a loss of any unsaved work. These problems are often the result of faulty memory. And while a truly bad memory module will often show its faults immediately after installation, a partially faulty one will not.
Which can lead to hours of diagnosing what seems like a normal problem that in reality is not normal at all. More extensive test options are available for those who want to dig deeper into potential problems. Read on for more information about this powerful program and order your copy today! On the first pass, this test writes the address of each memory cell to that cell itself.
On the second pass, the address is read and verified to ensure address space uniqueness. This test makes four passes. The first writes a pattern different for each run. This checks for adjacent bit sensitivity – a situation in which addresses other than the one being modified are affected. This test uses a complex algorithm consisting of six passes through memory. The final pass may travel either direction, verifying that the last write was successful. This test detects address faults, coupling faults, stuck-at faults, stuck-open faults, and transition faults.
This test first writes a series of random numbers into memory. Then, on the second pass, the initial pattern is verified. Testing with random values can help locate intermittent problems. This test is also helpful in checking for neighborhood pattern sensitivity. Over multiple runs, it can help identify temperature sensitivity.
This test writes a solid bit pattern into memory, for example all 1s. The initial pattern is checked and then complemented – switched to all 0s – and checked again. This checks that all addresses are both readable and writeable. This test moves a pattern through a field of 0s. The test detects changes in adjacent cells by looking for 1s where 0s are expected. Starting with the bit pattern , each memory cell is written and read to verify the pattern.
The 1 is moved over by one address and then the test is repeated for each position. This test ensures that each bit can maintain a value opposite of its neighboring bits, known as an intra-word coupling fault.
It can also find stuck address faults. The inverse of Walking Ones. A pattern of is the starting pattern, and the 0 is moved through memory. Useful for detecting intra-word coupling faults and stuck address faults. Combines the Walking Ones and Zeros with an alternating pattern. This test is also useful for detecting intra-word coupling faults and stuck address faults. This test is similar to the Walking Ones and Zeros tests.
Contact Affiliate Program Login Menu. Buy Now. View Details Add To Cart. The most comprehensive memory tester available for the Mac. The Test Algorithms. Stuck Address On the first pass, this test writes the address of each memory cell to that cell itself. Checkerboard This test makes four passes. Extended March C This test uses a complex algorithm consisting of six passes through memory. Random Values This test first writes a series of random numbers into memory.
Solid Bits This test writes a solid bit pattern into memory, for example all 1s. Bit Spread This test moves a pattern through a field of 0s. Walking Ones Starting with the bit pattern , each memory cell is written and read to verify the pattern.
Walking Zeroes The inverse of Walking Ones. Facebook-f Twitter.